An accurate methods for conductive layers characterization in millimeter-wave frequencies

Jerzy Cuper

supervisor: Paweł Kopyt

In the proposed research we aim at constructing new measurement equipment dedicated to characterization of conductive layers and as well as low-loss dielectric samples, which is of importance for industry and academia working on 5G/IoT technologies. The measurement set-up for characterization of these two types of materials will be based on Fabry-Perot open resonator (FPOR), which offers high Q-factor (> 10^5), while allows easy access to the cavity.

The set-up dedicated for characterization of conductive materials will be based on a modified configuration of the forementioned FPOR. The classical configuration of FPOR requires that two concave mirrors are employed. In our set-up one of the mirrors is replaced by a flat reflector (see Fig. 1.), which is used during a reference measurement and, then, by a material sample during the material measurement phase. Such resonant experiments are supposed to lead to obtaining conductivity of measured materials e.g. the metallization layer PCB substrate or bulk conductive materials (see Fig. 2.).