Jerzy Cuper
supervisor: Paweł Kopyt
In the proposed research we aim at constructing new measurement equipment dedicated to characterization of conductive layers and as well as low-loss dielectric samples, which is of importance for industry and academia working on 5G/IoT technologies. The measurement set-up for characterization of these two types of materials will be based on Fabry-Perot open resonator (FPOR), which offers high Q-factor (> 10^5), while allows easy access to the cavity.
The set-up dedicated for characterization of conductive materials will be based on a modified configuration of the forementioned FPOR. The classical configuration of FPOR requires that two concave mirrors are employed. In our set-up one of the mirrors is replaced by a flat reflector, which is used during a reference measurement and, then, by a material sample during the material measurement phase. Such resonant experiments are supposed to lead to obtaining conductivity of measured materials e.g. the metallization layer PCB substrate.
The second part of this research will be focused on developing reliable tool for material characterization of dielectric materials in THz regime. As a signal source we will use a commercial THz time-domain spectrometer. We are going to couple a FPOR composed of two concave mirrors with a THz beam emitted by the TDS, which seems to be the main challenge. Upon successful implementation of the concept, experiments leading to permittivity and loss tangent estimation of various materials are planned.